Testimonials

NaDiaProbes®



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NaDiaProbes Catalog

NaDiaProbes Catalog

NaDiaProbes Data Sheet

NaDiaProbes Data Sheet

Testimonials

NaDiaProbes Recognition & Awards

R&D 100 Award - Microscopy Category
2009 R&D 100 Award – Microscopy Category

Customer Quotes:

“I’ve used the all-diamond Dynamic Conductive Mode cantilevers in our Asylum Cypher AFM and found they last much longer than conventional silicon cantilevers. I ran it for over 1,000 scans in tapping mode (AC mode) on a trade show floor with minimal tip wear. The high spring constant also makes these tips ideal for demanding electrical applications such as Conductive AFM and Piezoresponse Force Microscopy where tip wear and electrostatics are an issue.”

Amir Moshar, Research Scientist, Asylum Research


“As for conductive NaDiaProbes, their performance was very good.”

Bohuslav Rezek, Ph.D. Research team leader and Purkyn? Fellow at the Department of Thin Films, Institute of Physics, Academy of Sciences of the Czech Republic


“We love them and want to buy some more.”

Email from a government lab team leader working on imaging inorganic and organic substrates


“The NaDiaProbes last about a month (per chip). They would last longer if we didn’t have to take them in and out to clean them.”

Paraphrased from a researcher performing conductive AFM and biological imaging


Peer-Reviewed Papers:

“Role of current profiles and AFM probes in electric crystallization of amorphous silicon,” by E. Verveniotis; B. Rezek; E. Šípek; J. Stuchlík; J. Ko?ka. Currently being peer reviewed.

Quote from abstract:

“Various types of conductive tips in atomic force microscope (AFM) are used to localize field enhanced metal-induced solid phase crystallization (FE-MISPC) of amorphous silicon at room temperature down to nanoscale dimensions. … Bulk diamond probes exhibit superior endurance compared to bare or coated silicon probes, nevertheless all tips generate similar FE-MISPC results.” Note: The ‘bulk diamond probes’ used in this paper were NaDiaProbes.


1, J. Felts1, Z. Dai1, H. Zheng2, J. A. Carlisle2, and W.P. King1*; 1Department of Mechanical Science and Engineering, University of Illinois, Urbana-Champaign, IL; Advanced Diamond Technologies, Romeoville, IL Currently submitted for peer review.

Quote from abstract:

“Wear tests were conducted under harsh conditions consistent with the requirements of tip-based nanofabrication. The wear tests were performed in contact mode with substrates of quartz, silicon carbide, silicon, and UNCD-coated silicon; tip load up to 200 nN, tip temperature 25-400 °C, scan speed 25 µm / sec, and scan distance > 1 m. Under these conditions, silicon tips are partially or completely destroyed but the UNCD-coated silicon tips exhibit zero or low wear.”

NaDia Probes Scanning Images

National Science Foundation

National Science Foundation’s Small Business Technology Transfer (STTR) Phase I and Phase II grants:

Diamond tips are well known for their hardness, low adhesion, and low wear properties in scanning probe techniques1

1Ph. Niedermann, W. Hãnni, D. Morel, A. Perret, N. Skinner, P.-F. Indermühle, N.-F. de Rooij, and P.-A. Buffat, Appl. Phys. A: Mater. Sci. Process. 66, S31 _1998_.

Diamond tip arrays are well suited as field emitters,3 due to diamond’s low work function _negative electron affinity_ and high solubilities/conductivities for both of N- and P-type doping, by nitrogen and boron, respectively.4,5

3W. P. Kang, J. L. Davidson, A. Wisitsora-at, Y. M. Wong, R. Takalkar, K. Holmes, and D. V. Kerns, Diamond Relat. Mater. 13, 1944 _2004_. 4I. Gerger and R. Haubner, Diamond Relat. Mater. 14, 369 _2005_. 5J. Zhang, S. T. Lee, and Y. W. Lam, Diamond Relat. Mater. 4, 678 _1995_.

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