|  NaDiaProbes:
All-Diamond AFM Probes
NaDiaProbes are made entirely of UNCD®--both
the tip and cantilever--in a single monolithic structure. These
are not diamond-coated probes; the cantilever and probe tip are
entirely made of diamond and demonstrate the astonishing control
and precision that is available with diamond today.
Benefits
Benefits of NaDiaProbes include:
- Increased wear performance compared to silicon (Si) or silicon
nitride (SiN) probes, yet fabricated with the same precision
and control
- Superior dimensional stability over many more scans compared
with Si or SiN probes
- Geometric tip radii typically between 20 to 30 nm, but image
resolution on flat, hard surfaces consistently smaller than
20 nm and can be as good as 10 nm or less
- Low surface energy leads to superior imaging performance on
soft, sticky substrates. Resists build-up of debris when imaging
soft materials
- Low friction inhibits sample damage during imaging
Imaging with NaDiaProbes: Examples from the Field:
A PowerPoint presentation showing examples of NaDiaProbes in action
Probes
Links to NaDiaProbes brochure and NaDiaProbes Spec Sheet
can be found below.
 Conductive
NaDiaProbes
Conductive NaDiaProbes
are all diamond probes with the cantilever and the probe tip
made of electrically conductive UNCD® with a resistivity
less than 1 ohm-cm. In addition to being electrically conductive,
NaDiaProbes display superior wear properties and long lifetimes.
Therefore, users who are frustrated with the delamination of
conductive metal coatings will be pleased to know NaDiaProbes
are conductive inside and out. No coating — all conductive
diamond.
Applications:
- Scanning Spreading Resistance Microscopy (SSRM)
- Oxidation Nanolithography
- E-Chem AFM
- Piezo-Force Microscopy
Dynamic (tapping) Mode NaDiaProbes
Dynamic Mode NaDiaProbes
are designed for the most common use of AFM probes — tapping
a surface. Due to diamond’s superior wear properties,
these probes are designed for imaging hard surfaces, any application
where long tip life is desirable (quality control processes)
and applications where silicon tips may break easily. Therefore
NaDiaProbes are also excellent for new AFM users.
Applications:
- Dynamic (tapping) Mode
- Wear Resistance on Hard Substrate
- Quality Control
- Nanomanufacturing
- New users (difficult to break a NaDiaProbe on impact; has
long life)
Contact Mode NaDiaProbes
Contact Mode NaDiaProbes are designed
for imaging hard surfaces for many scans. Extremely wear resistant,
NaDiaProbes last orders of magnitude longer than silicon nitride
(SiN) or silicon (Si) probes. Extremely durable, NaDiaProbes
are also perfect for new users or applications where a Si
tip may break easily.
Applications:
- Scanning hard surfaces in Contact Mode
- Quality control for production
- Nanomanufacturing
- New users
- Long-tip lifetimes
Brochures
& Specification Sheet
Buy NaDiaProbes
NaDiaProbes can be ordered from ADT directly (815.293.0900 or
www.shop.thindiamond.com).
NaDiaProbes can also be ordered through ADT's distributors - nanoScience
Instruments (U.S. or international), ITB
Corporation (Korea), or New
Metals Chemical Corporation (Japan):
 
New Metals & Chemicals Corporation
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